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Scanning electron microscopy and X-ray microanalysis

Goldsten, Joseph I. ... [et al.]

Scanning electron microscopy and X-ray microanalysis - 3rd ed. - Kluwer Academic / Plenum Publishers - xix, 689 p. + 1 CD

ISBN: 0-306-47292-9

Universal Decimal Class. No.: 537.533.35 P3

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Scanning electron microscopy and X-ray microanalysis

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