000 00438nam a2200169Ia 4500
003 CLRI
005 20151014152642.0
008 150617s1964 xx 000 0 eng d
040 _aCLRI
_bCLRI
_cCLRI
041 _heng
080 _a537.533: 578.6 K4
100 _aSiegel, Benjamin .M ed.
245 _aModern developments in electron microscopy
260 _aNew York
_c1964
_bAcademic Press
300 _axiii, 432 p.
942 _2DDC
_cBK
999 _c2517
_d2517
856 _uhttp://krc.clri.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=2517
_yhttp://krc.clri.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=2517