Scanning electron microscopy and X-ray microanalysis
Material type: TextOriginal language: English Publication details: Kluwer Academic / Plenum Publishers Edition: 3rd edDescription: xix, 689 p. + 1 CDISBN: 0-306-47292-9Online resources: http://krc.clri.res.in:80/cgi-bin/koha/opac-detail.pl?biblionumber=11029Item type | Current library | Call number | Status | Date due | Barcode |
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Book | CSIR-CLRI | Available | 18489 |
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